Solar Wafer Inspection & Sorting Equipment


Advantages
-
Enhanced Capacity
-
High Inspection Accuracy
-
Enhanced Capacity
50%+ higher capacity vs. previous generation
50% faster wafer transfer via patented Bernoulli air-suspension technology
-
High Inspection Accuracy
Enhanced module performance with upgraded algorithms
Self-developed AOI 4.0 platform significantly elevates defect detection rate and processing speed
PRODUCT SPECIFICATIONS
-
Solar Wafer Inspection & Sorting Equipment
-
-
Single Machine Throughput
20,000 wph
-
Wafer Sizes
Full wafers 166–230 mm & half wafers 182–230 mm
-
Geometric Tolerance
≤30μ (3σ)
-
Thickness Uniformity
≤0.5μ (3σ)
-
Resistivity Variation
≤2% (3σ)
-
Stain and Edge Chipping Detection Rate
≥98%
-
Crack/Pinhole Detection Rate
100%
-
Fragmentation Rate
<0.05%
-
Miss-recognition Rate
<0.15%
-
False Call Rate
<0.3%
-
Escape Rate
<0.2%
-
Scalability & Integration
Designed for fully automated production lines with modular unloading
-