DaVinci

High-Precision Overlay Measurement Platform for Advanced Wafer Manufacturing
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DaVinci series is a high-precision solution specifically engineered for overlay error measurement in semiconductor wafer manufacturing process. With its innovative frame design and fully operational automation, it delivers stable and reliable measurement capacapability with sub-nanometer accuracy.
By integrating a user-friendly software interface with automated recipe generation and optimization functions, it significantly simplifies operation workflows, enhances measurement efficiency, and ensures consistency. Additionally, the system is equipped with the standard SECS/GEM communication protocol to ensure seamless integration with fab automation systems, supporting high-throughput demands in mass production environments.
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Advantages

  • Ultra-High Measurement Accuracy

  • Flexible and User-Friendly

  • Mature, Stable, and Reliable

  • Ultra-High Measurement Accuracy

    Precision down to the sub-nanometer level

  • Flexible and User-Friendly

    Compatible with 8-inch and 12-inch wafers, including combinational configuration

  • Mature, Stable, and Reliable

    Low cost of ownership, easy maintenance, and no short-lifecycle consumables

Training Certificate Inquiry

Inquiry

If you have any questions regarding the certificate inquiry, please contact us

Training Certificate Query Result

  • Customer Name

    Guo Lianlian

  • Company Name

    Shenzhen Dinghua Xintai Technology Co., Ltd.

  • Training Time

    November 21, 2021

  • Training Content

    1. Basic Introduction, 2. Exposure Operation, 3. Part Number Creation, 4. Daily Maintenance

  • Training Result

    Qualified

  • Certificate Number

    21TZLT011021