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TB1100

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For customers with 65 nm-180 nm technology nodes Compatible with 8-inch/12-inch wafers
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Advantages

  • High Sensitivity

  • High Throughput

  • Intelligent Software Support:

  • High Sensitivity

    Capable of consistently detecting defects as small as 70 nm

    Advanced signal processing algorithms enhance the signal-to-noise ratio

    Broadband technology allows detection of various types of defects

  • High Throughput

    High data rate 

    Multiple pixel size options 

    Supports high-speed scanning mode 

  • Intelligent Software Support:

    Online Intelligent Classification System SDA 

    Process Window Qualification

Training Certificate Inquiry

Inquiry

If you have any questions regarding the certificate inquiry, please contact us

Training Certificate Query Result

  • Customer Name

    Guo Lianlian

  • Company Name

    Shenzhen Dinghua Xintai Technology Co., Ltd.

  • Training Time

    November 21, 2021

  • Training Content

    1. Basic Introduction, 2. Exposure Operation, 3. Part Number Creation, 4. Daily Maintenance

  • Training Result

    Qualified

  • Certificate Number

    21TZLT011021