Semiconductor Industry Solutions

High magnification automatic zoom lens with magnification range of 25 to 338 times

DaVinci Series Overlay Precision Measurement System – Semiconductor Wafer Manufacturing Process Control Solution The DaVinci Overlay Error Precision Measurement System is a high-precision solution for semiconductor manufacturing. With its unique frame design and fully automated operation, it delivers long-term, stable, and highly accurate measure

Meet the measurement needs of complex parts with excellent accuracy, high efficiency and stable performance

Automatic zoom lens with magnification range of 25x to 209x

MT3000 Series Wafer Measurement System – Optical Metrology Solutions for Semiconductor Manufacturing The MT3000 Series is an advanced optical metrology platform designed for a wide range of semiconductor applications. It supports fully automated measurement of critical parameters such as linewidth, overlay errors, and dielectric film thickness on

Meet the user's basic needs for 3D measurements, with high precision, versatility, automation, flexibility