CIEC Beijing | TZTEK's "AI Smart Measurement" Wins Innovation Award; Self-Developed New Products Debut in Beijing

From May 20 to 22, coinciding with the 27th World Metrology Day, the 8th China International Metrology Measurement Technology and Equipment Exhibition was held in Beijing. TZTEK showcased its ultra-high-precision measurement solutions at the exhibition. In recognition of its innovative breakthroughs in core technologies and AI applications, TZTEK was awarded the "Intelligent Metrology Equipment Innovation Award" by the exhibition organizers and invited to deliver a keynote speech at the concurrent technical forum.

TZTEK’s Practice: Building Barriers for High-End Metrology from Core Components to AI Software

With over two decades of deep cultivation in precision measurement, TZTEK adheres to a dual-core development strategy of "Artificial Intelligence + Precision Opto-Mechatronics". It has independently developed and iteratively upgraded core components such probe heads and control systems. Centered on the theme "AI Intelligent Metrology" for this exhibition, TZTEK displayed a full portfolio of measurement solutions adaptable to both laboratory environments and on-site industrial production. Among them, the CMZ metrology-grade coordinate measuring machine (CMM) and the VMZ ultra-high-precision video measuring machine(VMM) garnered significant attention.

CMZ Metrology-Grade Coordinate Measuring Machine: Certified by the National Institute of Metrology (NIM), China, this model achieves an accuracy of 0.5 μm, meeting the 3D measurement demands for complex features in aerospace, precision machining, and other fields.

VMZ Ultra-High-Precision Video Measuring Machine: Equipped with nano-scale zero-expansion linear scales and ultra-precision linear guides, it offers a magnification of up to 6000x and an accuracy of 0.8 μm. It is designed to meet the needs of ultra-high-precision measurement in semiconductors, optical communications, gauge inspection, aerospace, and other sectors.

Furthermore, new products recently unveiled at CCMT in Shanghai—the TR50 rotary probe head and the CSP scanning probe— were also on display at the Beijing Metrology Exhibition. The TR50 boasts a core positioning repeatability of 0.5 μm and a minimum indexing step of 5°, significantly expanding the coverage for complex angular measurements. The CSP scanning probe supports both single-point detection and continuous high-speed scanning. Also on display was the VMM Software 2.0, which introduces deep learning algorithms to enable intelligent edge detection and automatic parameter adjustment. This effectively addresses the pain point of traditional vision measurement requiring repeated manual intervention, propelling precision measurement from "automation" toward "intelligence."

TZTEK's Metrology Center has obtained national CNAS accreditation (Registration No.: CNAS L24445). Leveraging solid technological accumulation and standardized accreditation systems, TZTEK's measuring equipment meets the urgent demands for high-end measurement in strategic industries such as aerospace and semiconductors, balancing lab-grade precision with factory-grade operational efficiency.

Expert Insight: Domestic Metrology Shifts from Catching Up to Running Neck-and-Neck; AI Intelligent Metrology Charts New Trajectory

During the exhibition, Mr. Zhang Heng from the National Institute of Metrology, China visited TZTEK’s booth and  gave an interview to Instrument.com.cn, offering live commentary on the development of domestic precision metrology technology.

Mr. Zhang pointed out that the rapid development of China's high-end manufacturing sector in recent years means that product quality improvement relies heavily on precision measurement and instrumentation. Leading domestic enterprises represented by TZTEK have reached a global level of parallel competitiveness. “Products from these enterprises fully satisfy domestic manufacturing demands, featuring prominent advantages in technology and cost performance, earning widespread market recognition.”

He showed keen interest in TZTEK’s self-developed TR50 probe head and CSP compact scanning probe. He discussed details such as the head's repeatability and probe compatibility with technical engineers, and offered his full affirmation. " “Precision probes were long monopolized by foreign brands; domestic manufacturers have now broken this stranglehold.”

Regarding the booming AI intelligent metrology trend, Mr. Zhang stated that the shift from automated to intelligent precision measurement is an irreversible industrial megatrend Technologies like AI vision and intelligent edge detection can effectively solve pain points in traditional measurement, such as low efficiency and high manual error rates. He also acknowledged that AI metrology technology is still in a phase of development and iteration, calling for refined industry standards and sustained technical investment moving forward.

Speaking about the exhibition being held in Beijing for the first time, Mr. Zhang expressed his pleasant surprise. "An exhibition is proof of industry demand. That it can be held in Beijing indicates the urgent need for exchange regarding high-end metrology equipment between the research community and industry. This change is a direct reflection of the thriving domestic metrology industry."

During the exhibition, TZTEK received the "Intelligent Metrology Equipment Innovation Award" from the organizing committee in recognition of its technological innovation and application achievements in the field of intelligent metrology equipment. This award represents the industry's high regard for TZTEK's R&D and industrial application of AI metrology technology.

Outlook : Driving the High-Quality Advancement of Domestic Metrology through Innovation

Metrology is the "eye" of industrial manufacturing and a crucial foundation for developing new quality productive forces. This exhibition highlighted the latest R&D achievements in domestic high-end metrology instruments and equipment, directly reflecting that the industry is in a period of rapid growth characterized by technological breakthroughs, import substitution, and intelligent upgrading.

Looking ahead, TZTEK will remain guided by national industrial demands, continuously optimizing product performance and refining full-scenario solutions. Simultaneously, the company will actively participate in industry standard development and promote the deep application of artificial intelligence in the field of metrology, providing solid support for the high-quality development of advanced manufacturing.