Solar Wafer Inspection & Sorting Equipment
Advantages
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Enhanced Capacity
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High Inspection Accuracy
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Enhanced Capacity50%+ higher capacity vs. previous generation
50% faster wafer transfer via patented Bernoulli air-suspension technology
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High Inspection AccuracyEnhanced module performance with upgraded algorithms
Self-developed AOI 4.0 platform significantly elevates defect detection rate and processing speed
PRODUCT SPECIFICATIONS
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Solar Wafer Inspection & Sorting Equipment
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Single Machine Throughput
20,000 wph
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Wafer Sizes
Full wafers 166–230 mm & half wafers 182–230 mm
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Geometric Tolerance
≤30μ (3σ）
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Thickness Uniformity
≤0.5μ (3σ）
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Resistivity Variation
≤2% (3σ）
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Stain and Edge Chipping Detection Rate
≥98%
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Crack/Pinhole Detection Rate
100%
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Fragmentation Rate
<0.05%
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Miss-recognition Rate
<0.15%
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False Call Rate
<0.3%
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Escape Rate
<0.2%
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Scalability & Integration
Designed for fully automated production lines with modular unloading
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